3D Profilometer Technical Documentation Portable Type 3D Surface Inspection Device
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Understanding and quantifying the surface of samples is extremely important in many application areas, including quality control and research. To study surfaces, it is common to scan and image samples using a profilometer. A major challenge with conventional profilometry devices is their inability to accommodate non-standard samples. The difficulty in measuring non-standard samples may arise from factors such as sample size, shape, the impossibility of sample movement, or other inconvenient sample preparation. The JR series, a portable 3D non-contact profilometer from Nanovia, can resolve most of these issues due to its ability to scan sample surfaces from various angles and its portability.
- Company：アイ・ティー・エス・ジャパン
- Price：Other
